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Methods and means for measurement of external influences on the base fiber-optic interferometers

UDC 536.46
Authors Il'yushonok Aleksandr Vasil'evich, PhD in Physico-Mathematical Sciences, Associate Professor
Goncharenko Igor' Andreevich, Grand PhD in Physico-Mathematical Sciences, Associate Professor
Leshenyuk Nikolay Stepanovich, Grand PhD in Physico-Mathematical Sciences, Professor
Kuleshov Vladimir Konstantinovich, PhD in Technical Sciences
Tereshenkov Vladimir Ivanovich, PhD in Physico-Mathematical Sciences, Associate Professor
Abstract Purpose. The development of the design and operation principles of the sensor on the base of fiber-optic interferometers and resonators, the use of which provides increasing of measuring accuracy.
Findings. Vectoral sensor on the base of fiber interferometers makes it possible to measure the value and direction of the controlled object deformation. The measurement range is up to 5 mm, the accuracy is defined by the step of the scanning mirror shift and is 10 µm. The sensors on the base of slot waveguide ring micro resonators with LC filling can be used for measuring the external electric fields in the range between 0 and 3?106 V?m with accuracy up to 1 V/m. The operating speed of the device is defined by the response time of the LC. The operating speed of the proposed device is limited mostly by the response time of the LC and varies from tens to hundreds of microseconds. That allows measuring the variable electric fields with frequencies up to tens of KHz.
Application field of research. The developed structure and operating principle of the proposed devices can serve as a basis for creating fiber-optic sensors for measuring the pressure, displacement of the controlled object and the external electric fields intensity.
Conclusions. The presented research showed that the use sensors on the base of fiber-optic interferometers and resonators makes it possible to measure of the controlled object deformation and electric field intensity with high accuracy.
Keywords michelson fiber optic interferometer, deformation, slot waveguide, liquid crystal, ring resonator, electric field intensity
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